Title :
A TEM-cell based method for radiative susceptibility characterization of low-power microcontrollers
Author :
Engel, Andy ; Astrain, Hector ; Cagle, John ; Ledford, Steven ; Mahalingam, Mali
Author_Institution :
AISL, Tempe, AZ, USA
Abstract :
The recent explosion in the portable electronics market combined with an increasingly hostile electromagnetic environment have intensified the need to include EM susceptibility design and test methods in applicable low-power ICs. This work presents and applies a TEM-cell based method of testing two key aspects-quiescent current and memory integrity-of the radiative susceptibility of low-power microcontrollers. The units were exposed to radiated EM fields of 20 to 1000 V/m at various frequencies from 0.1 to 1000 MHz. Significant changes in quiescent current occurred only at field values above 70 V/m, which is a much larger ambient field than the microcontroller is expected to experience when used in personal portable electronics products. RAM was changed only after illumination by fields of greater than 275 V/m
Keywords :
electromagnetic interference; integrated circuit testing; microcontrollers; 0.1 to 1000 MHz; EM field; RAM; TEM cell; low-power microcontroller; memory integrity; portable electronics; quiescent current; radiative susceptibility; testing; Consumer electronics; Design methodology; Digital integrated circuits; Electromagnetic interference; Electromagnetic radiation; Electronic equipment testing; Explosions; Integrated circuit noise; Integrated circuit testing; Microcontrollers;
Conference_Titel :
Electromagnetic Compatibility, 1996. Symposium Record. IEEE 1996 International Symposium on
Conference_Location :
Santa Clara, CA
Print_ISBN :
0-7803-3207-5
DOI :
10.1109/ISEMC.1996.561205
