DocumentCode
2704013
Title
Temperature and stress time history responses in electronic packaging
Author
Lau, John H.
Author_Institution
Hewlett-Packard Co., Palo Alto, CA, USA
fYear
1995
fDate
21-24 May 1995
Firstpage
952
Lastpage
958
Abstract
The closed-form thermoelasticity solutions of electronic packages subjected to an instantaneous source of heat, and a heat source varying harmonically as function of time are presented. Useful curves and charts which relate the variables, time, frequency, heat, temperature, stress, displacement, and material property are also provided for engineering practice convenience. Also, the. Present results can be used to verify finite element analysis procedures and interpret experimental data
Keywords
finite element analysis; packaging; thermal analysis; thermal stresses; thermoelasticity; closed-form thermoelasticity solutions; electronic packaging; finite element analysis; heat source; stress time history response; Electronics packaging; Frequency; History; Poisson equations; Space heating; Temperature distribution; Thermal conductivity; Thermal expansion; Thermal force; Thermal stresses;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 1995. Proceedings., 45th
Conference_Location
Las Vegas, NV
Print_ISBN
0-7803-2736-5
Type
conf
DOI
10.1109/ECTC.1995.517805
Filename
517805
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