• DocumentCode
    2704013
  • Title

    Temperature and stress time history responses in electronic packaging

  • Author

    Lau, John H.

  • Author_Institution
    Hewlett-Packard Co., Palo Alto, CA, USA
  • fYear
    1995
  • fDate
    21-24 May 1995
  • Firstpage
    952
  • Lastpage
    958
  • Abstract
    The closed-form thermoelasticity solutions of electronic packages subjected to an instantaneous source of heat, and a heat source varying harmonically as function of time are presented. Useful curves and charts which relate the variables, time, frequency, heat, temperature, stress, displacement, and material property are also provided for engineering practice convenience. Also, the. Present results can be used to verify finite element analysis procedures and interpret experimental data
  • Keywords
    finite element analysis; packaging; thermal analysis; thermal stresses; thermoelasticity; closed-form thermoelasticity solutions; electronic packaging; finite element analysis; heat source; stress time history response; Electronics packaging; Frequency; History; Poisson equations; Space heating; Temperature distribution; Thermal conductivity; Thermal expansion; Thermal force; Thermal stresses;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1995. Proceedings., 45th
  • Conference_Location
    Las Vegas, NV
  • Print_ISBN
    0-7803-2736-5
  • Type

    conf

  • DOI
    10.1109/ECTC.1995.517805
  • Filename
    517805