DocumentCode :
2704077
Title :
The importance of molding compound chemical shrinkage in the stress and warpage analysis of PQFPs
Author :
Kelly, G. ; Lyden, C. ; Lawton, W. ; Barrett, J. ; Saboui, A. ; Pape, H. ; Peters, H.
Author_Institution :
Nat. Microelectron. Res. Centre, Univ. Coll. Cork, Ireland
fYear :
1995
fDate :
21-24 May 1995
Firstpage :
977
Lastpage :
981
Abstract :
This paper addresses the use of finite element techniques to predict residual warpage in PQFPs after encapsulation. Experimental measurements of package warpage are used to validate finite element models of the packages. Failure to incorporate mold compound chemical shrinkage into the FE analysis leads to erroneous predictions of package warpage. The warpage sensitivity of different packages to changes in downset is presented. The validated FE package models predict stress levels in packages which are 70% greater than those with TCE shrinkage alone and questions the accuracy of previously simulations which do not include molding compound chemical shrinkage
Keywords :
encapsulation; finite element analysis; integrated circuit packaging; plastic packaging; shrinkage; PQFPs; TCE shrinkage; chemical shrinkage; downset; encapsulation; finite element techniques; molding compound; residual warpage; stress levels; warpage analysis; Chemical analysis; Chemical compounds; Finite element methods; Integrated circuit modeling; Microelectronics; Packaging; Plastics; Predictive models; Temperature; Tensile stress;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 1995. Proceedings., 45th
Conference_Location :
Las Vegas, NV
Print_ISBN :
0-7803-2736-5
Type :
conf
DOI :
10.1109/ECTC.1995.517809
Filename :
517809
Link To Document :
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