DocumentCode :
2704260
Title :
Effect of PCB finish on the reliability and wettability of ball grid array packages
Author :
Bradley, Edwin ; Banerji, Kingshuk
Author_Institution :
Adv. Manuf. Technol., Motorola, Ft. Lauderdale, FL, USA
fYear :
1995
fDate :
21-24 May 1995
Firstpage :
1028
Lastpage :
1038
Abstract :
Organic protective coatings (OPC) and metallic plating chemistries have emerged as alternatives to traditional hot air solder leveling (HASL) to ensure the solderability of printed circuit boards (PCB). This study examined a number of commercially-available printed circuit board finishes to determine their intrinsic solderability and their effect on the solder joint reliability of Ball Grid Array (BGA) packages. The PCB finishes included OPC (two different chemistries), immersion Au over electroless Ni (four chemistries), electroless Pd over Ni, immersion tin over Cu, immersion Bi over Cu and HASL. Solderability tests were performed by reflowing 20 mil diameter solder spheres on various aged test coupons and then quantitatively measuring the area and shape of the solder after cooling. The immersion Au finishes exhibited generally excellent wettability as a function of N2 reflow aging as compared with the OPCs and HASL. The Pd-Ni, tin, and one of the Ni-Au finishes exhibited poor wetting when exposed to an 85°C/85% RH environment. Solder joint reliability was measured for a 41 I/O ceramic BGA using cyclic thermal shock (nominally -55°C to 125°C) and three point bending. All finishes tested achieved good results in bending, but the Au finishes performed poorly in thermal shock as compared to OPC and HASL. The wetting and reliability results are correlated with the structure and composition of the finishes and the solder joints
Keywords :
bending; circuit reliability; integrated circuit packaging; printed circuit manufacture; protective coatings; soldering; thermal shock; wetting; -55 to 125 C; Au-Ni; BGA packages; Bi-Cu; Cu; N2; N2 reflow aging; Ni; PCB finish; Pd-Ni; Sn-Cu; aged test coupons; ball grid array packages; ceramic BGA; circuit reliability; cyclic thermal shock; electroless Pd over Ni; immersion Au over electroless Ni; immersion Pi over Cu; immersion Sn over Cu; metallic plating chemistries; organic protective coatings; printed circuit boards; solder joint reliability; solderability; three point bending; wettability; Aging; Chemistry; Electric shock; Gold; Performance evaluation; Printed circuits; Shape measurement; Soldering; Testing; Tin;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 1995. Proceedings., 45th
Conference_Location :
Las Vegas, NV
Print_ISBN :
0-7803-2736-5
Type :
conf
DOI :
10.1109/ECTC.1995.517818
Filename :
517818
Link To Document :
بازگشت