DocumentCode :
2704542
Title :
Diagnostic test generation for transition faults using a stuck-at ATPG tool
Author :
Higami, Yoshinobu ; Kurose, Yosuke ; Ohno, Satoshi ; Yamaoka, Hironori ; Takahashi, Hiroshi ; Shimizu, Yoshihiro ; Aikyo, Takashi ; Takamatsu, Yuzo
Author_Institution :
Grad. Sch. of Sci. & Eng., Ehime Univ., Matsuyama, Japan
fYear :
2009
fDate :
1-6 Nov. 2009
Firstpage :
1
Lastpage :
9
Abstract :
This paper presents a diagnostic test generation method for transition faults. As two consecutive vectors application mechanism, launch on capture test is considered. The proposed algorithm generates test vectors for given fault pairs using a stuck-at ATPG tool so that they are distinguished. If a given fault pair is indistinguishable, it is identified. Therefore the proposed algorithm provides a complete test generation regarding the distinguishability. The conditions for distinguishing a fault pair are carefully considered, and they are transformed into the conditions of the detection of a stuck-at fault, and some additional logic are inserted in a CUT for the test generation. Experimental results show that the proposed method can generate test vectors for distinguishing the fault pairs that are not distinguished by commercial tools, and also identify all the indistinguishable fault pairs.
Keywords :
automatic test pattern generation; fault diagnosis; diagnostic test generation; stuck-at ATPG tool; transition faults; Automatic test pattern generation; Circuit faults; Circuit testing; Delay; Fault detection; Fault diagnosis; Large scale integration; Logic testing; Manufacturing processes; Semiconductor device testing; Fault diagnosis; Stuck-at ATPG; Test generation; Transition faults;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 2009. ITC 2009. International
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-4868-5
Electronic_ISBN :
978-1-4244-4867-8
Type :
conf
DOI :
10.1109/TEST.2009.5355681
Filename :
5355681
Link To Document :
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