• DocumentCode
    2704588
  • Title

    Performance comparison of thermally enhanced plastic (TEP) packages

  • Author

    Stearns, Bill ; Simon, Philip B. ; Murtuza, Masood

  • Author_Institution
    Texas Instrum. Inc., Dallas, TX, USA
  • fYear
    1995
  • fDate
    21-24 May 1995
  • Firstpage
    1134
  • Lastpage
    1139
  • Abstract
    Plastic packages have long been the mainstay of VLSI packaging due to a combination of important characteristics such as cost, reliability, and mass producibility. However standard plastic packages and higher pin-count standard plastic quad flat pack (PQFP) packages do not readily lend themselves to applications over 1-2 watts. Over the last few years several techniques have been used to enhance the thermal performance of plastic packages. These include the addition of a thin metal sheet referred to as a heat spreader or a thicker piece of metal called a heat slug internal to the package. These thermal enhancers behave differently depending on the external environment and the printed circuit board´s ability to carry heat away from the package. They also have important differences in other aspects such as cost and manufacturability. This paper discusses several different types of thermally enhanced plastic (TEP) packages, their thermal performance under different ambient conditions, relative costs and manufacturability, and the effects on thermal performance depending on the test environment and how the measurements are made. Such an analysis is useful in selecting the right type of thermally enhanced packages for a given application
  • Keywords
    VLSI; integrated circuit packaging; plastic packaging; PQFP packages; VLSI; costs; heat slug; heat spreader; manufacturability; metal sheet; printed circuit board; thermal performance; thermally enhanced plastic packages; Circuit testing; Copper; Costs; DH-HEMTs; Electronics packaging; Heat sinks; Lead; Plastic packaging; Surface resistance; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1995. Proceedings., 45th
  • Conference_Location
    Las Vegas, NV
  • Print_ISBN
    0-7803-2736-5
  • Type

    conf

  • DOI
    10.1109/ECTC.1995.517834
  • Filename
    517834