• DocumentCode
    2704658
  • Title

    Equal Area Estimation of Three-Parameter Logistic Model for Item Response Theory

  • Author

    Lo, Shih-Ching

  • Author_Institution
    Dept. of Transp. Technol. & Logistics Manage., Chung-Hua Univ., Hsinchu
  • fYear
    2008
  • fDate
    9-12 Dec. 2008
  • Firstpage
    1447
  • Lastpage
    1452
  • Abstract
    Item response theory (IRT) is used commonly for design of tests, test assembly, test scaling and calibration, construction of test item banks, investigations of test item bias, and other common procedures in the test development process. Logistic function is the most popular unidimensional IRT model. Applications of IRT models require obtaining the set of values for logistic function parameters that best fit an empirical data set. However, success in obtaining such set of values does not guarantee that the constructs they represent actually exist, for the adequacy of a model is not sustained by the possibility of estimating parameters. In this study, an Equal ARea Logistic estimation algorithm (EARL) is proposed. The EARL algorithm can estimate the parameters, which are discrimination, difficulty and pseudo-guessing level, of the logistic model. Numerical results of two-parameter and three-parameter estimation are presented to show the stability, accuracy and time-saving of the algorithm.
  • Keywords
    design for testability; logistics; parameter estimation; design of tests; equal area logistic estimation algorithm; item response theory; logistic function; test assembly; test item banks; test item bias; test scaling; three-parameter estimation; three-parameter logistic model; unidimensional IRT model; Assembly; Calibration; Conference management; Iterative algorithms; Logistics; Maximum likelihood estimation; Parameter estimation; Technology management; Testing; Transportation; equal area construction; item response theory; logistic model;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Asia-Pacific Services Computing Conference, 2008. APSCC '08. IEEE
  • Conference_Location
    Yilan
  • Print_ISBN
    978-0-7695-3473-2
  • Electronic_ISBN
    978-0-7695-3473-2
  • Type

    conf

  • DOI
    10.1109/APSCC.2008.31
  • Filename
    4780883