DocumentCode :
2704724
Title :
Finding Attractors in Synchronous Multiple-Valued Networks Using SAT-Based Bounded Model Checking
Author :
Dubrova, Elena ; Teslenko, Maxim ; Ming, Liu
Author_Institution :
R. Inst. of Technol. (KTH), Stockholm, Sweden
fYear :
2010
fDate :
26-28 May 2010
Firstpage :
144
Lastpage :
149
Abstract :
Synchronous multiple-valued networks are a discrete-space discrete-time model of the gene regulatory network of living cells. In this model, cell types are represented by the cycles in the state transition graph of a network, called attractors. When the effect of a disease or a mutation on a cell is studied, attractors have to be re-computed each time a fault is injected in the model. This motivates research on algorithms for finding attractors. Existing decision diagram-based approaches have limited capacity due to the excessive memory requirements of decision diagrams. Simulation-based approaches can be applied to larger networks, however, they are incomplete. We present an algorithm for finding attractors which uses a SAT-based bounded model checking. Our model checking approach exploits the deterministic nature of the network model to reduce runtime. Although the idea of applying model checking to the analysis of gene regulatory networks is not new, to our best knowledge, we are the first to use it for computing all attractors in a model. The efficiency of the presented algorithm is evaluated by analyzing 7 networks models of real biological processes as well as 35.000 randomly generated 4-valued networks. The results show that our approach has a potential to handle an order of magnitude larger models than currently possible.
Keywords :
Biological system modeling; Differential equations; Diseases; Explosions; Formal verification; Genetic mutations; Large-scale systems; Logic; Organisms; Signal analysis; SAT; attractor; bounded model checking; gene regulatory network; multiple-valued network;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Multiple-Valued Logic (ISMVL), 2010 40th IEEE International Symposium on
Conference_Location :
Barcelona, Spain
ISSN :
0195-623X
Print_ISBN :
978-1-4244-6752-5
Type :
conf
DOI :
10.1109/ISMVL.2010.35
Filename :
5489232
Link To Document :
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