Title : 
Organic coatings and the challenge-no clean presents
         
        
            Author : 
Gutierrez, S. ; Thune, P.
         
        
            Author_Institution : 
IBM PC Co., Austin, TX, USA
         
        
        
        
        
        
            Abstract : 
Organic solderability preservatives (OSP´s) are rapidly being implemented within the PCB fabrication industry. OSP´s have shown to be excellent corrosion inhibitors and solderability preservatives. However, little has been reported on the “processability” during second level assembly. A small number of PCB assemblers, IBM included, have successfully used Benzotriazole (BTA) based OSP for a number of years. The BTA/OSP the Austin facility has been using will be compared to a new, next generation Benzimidazole (BIM) OSP on the market. Sequential Electrochemical Reduction Analysis (SERA) is an analytical method designed to correlate the type and amount of oxide species present on a PCB metal surface to its solderability, However, in this study we have attempted to characterize and correlate the PCB´s processability, i.e., reflow atmosphere and In-Circuit Test, to the SERA results. This paper will report on the process challenges OSP´s must meet for successful use in No-Clean solder assembly
         
        
            Keywords : 
assembling; coatings; corrosion protective coatings; printed circuit manufacture; production testing; reduction (chemical); reflow soldering; PCB fabrication industry; benzimidazole OSP; benzotriazole-based OSP; corrosion inhibitors; in-circuit test; no-clean solder assembly; organic solderability preservatives; processability; reflow atmosphere; second level assembly; sequential electrochemical reduction analysis; Assembly; Atmosphere; Chemical technology; Coatings; Corrosion; Costs; Lead; Legislation; Manufacturing processes; Soldering;
         
        
        
        
            Conference_Titel : 
Electronic Components and Technology Conference, 1995. Proceedings., 45th
         
        
            Conference_Location : 
Las Vegas, NV
         
        
            Print_ISBN : 
0-7803-2736-5
         
        
        
            DOI : 
10.1109/ECTC.1995.517846