DocumentCode :
2704965
Title :
Analysis of design of experiments used as a tool to implement environmentally safe cleaning process in manufacturing [hybrid ICs]
Author :
Jensen, Kent ; Paralkar, Prasanna
Author_Institution :
Div. of Integrated Technol., Bourns Inc., Logan, UT, USA
fYear :
1995
fDate :
21-24 May 1995
Firstpage :
1250
Lastpage :
1253
Abstract :
Due to concerns for the environment and due to international treaties which will soon ban the use of certain environmentally destructive cleaning solvents (Chlorofluorocarbons, 1,1,1 Trichloroethane, etc.), the typical post-solder cleaning processes used for the manufacturing of electronic components have had to be addressed. A case study of a hybrid component which utilized a cleaning process requiring change is discussed. It was determined that the best tool to evaluate alternatives was the use of design of experiments (DOE). This DOE evaluates several cleaning alternatives on a custom hybrid (passive resistor array) product. This full factorial DOE consisted of the following three variables (1) water quality, (2) lead attach flux/cleaning method, and (3) conductor ink composition of the hybrid. The primary output of the DOE was change in electrical resistance due to a humidity test (85°C/85%RH/1000hr). Based on the results of this primary output, one set of conditions was selected as the best. Additional functional testing was performed. The results of the humidity as well as the functional tests are discussed
Keywords :
application specific integrated circuits; design of experiments; electronic equipment manufacture; environmental factors; humidity measurement; hybrid integrated circuits; surface cleaning; thick film circuits; 1,1,1 trichloroethane; chlorofluorocarbons; cleaning solvents; conductor ink composition; custom hybrid IC; design of experiments; electrical resistance; environmentally safe cleaning process; functional testing; humidity test; lead attach flux/cleaning method; passive resistor array; post-solder cleaning processes; water quality; Cleaning; Conductors; Electronic components; Humidity; Ink; Manufacturing processes; Resistors; Solvents; Testing; US Department of Energy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 1995. Proceedings., 45th
Conference_Location :
Las Vegas, NV
Print_ISBN :
0-7803-2736-5
Type :
conf
DOI :
10.1109/ECTC.1995.517851
Filename :
517851
Link To Document :
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