Title :
3D Multilevel Non-Uniform Grid Algorithm for Fast Field Evaluation
Author :
Brick, Yaniv ; Boag, Amir
Author_Institution :
Sch. of Electr. Eng., Tel Aviv Univ.
Abstract :
The analysis of large scattering problems is often performed using iterative method-of-moments (MoM) solvers. The main computational bottleneck of such iterative solvers stems from the need to perform at each iteration at least one matrix-vector product, which is equivalent to field evaluation for a given source distribution. The O(N2) complexity and memory needs of direct matrix-vector multiplication (N being the number of unknowns), underscores the need for fast field evaluation techniques. The multilevel fast multipole algorithm (MLFMA) achieves an O(NlogN) complexity for dynamic frequency domain problems. Also, the recently introduced non-uniform grid (NG) algorithm promises to achieve a similar asymptotic complexity and storage requirements while allowing analysis time-domain problems as well as virtually seamless transition from dynamic to quasi-static regime. In comparison with the MLFMA, the implementation of the NG is straightforward. This paper presents a 3D dynamic scalar field evaluation performed at O(NlogN) operations using a multilevel NG (MLNG) algorithm. The scalar case allows us to explore the main features of the MLNG while somewhat simplifying the formulation
Keywords :
computational complexity; electromagnetic wave scattering; time-domain analysis; 3D multilevel nonuniform grid algorithm; MoM solvers; direct matrix-vector multiplication; dynamic scalar field evaluation; fast field evaluation techniques; iterative method-of-moments solvers; matrix-vector product; multilevel fast multipole algorithm; scattering problems; time-domain problems; Algorithm design and analysis; Distributed computing; Frequency domain analysis; Iterative algorithms; Iterative methods; MLFMA; Moment methods; Performance analysis; Performance evaluation; Scattering;
Conference_Titel :
Antennas and Propagation Society International Symposium 2006, IEEE
Conference_Location :
Albuquerque, NM
Print_ISBN :
1-4244-0123-2
DOI :
10.1109/APS.2006.1711516