BIST scheme for RF VCOs allowing the self-correction of the cut

Author

Testa, L. ; Lapuyade, H. ; Deval, Y. ; Mazouffre, O. ; Carbonero, J.L. ; Begueret, J.B.

Author_Institution

IMS Lab., Bordeaux, France

fYear

2009

fDate

1-6 Nov. 2009

Firstpage

1

Lastpage

10

Abstract

In order to implement a built-in self-test (BIST) strategy for a radio frequency (RF) LC-voltage controlled oscillator (VCO) devoted to WiMax applications, an exhaustive study of the fault coverage achievable for this block is carried out. The peak-to-peak value of the output voltage is shown to be the best quantity to monitor. Once the fault is detected, it is shown that the BIST can be exploited as well to trigger a feedback allowing, in some cases, the self-correction of the VCO. The complete system is designed using the STM CMOS 65 nm process.

Keywords

CMOS integrated circuits; built-in self test; integrated circuit testing; radiofrequency oscillators; voltage-controlled oscillators; BIST scheme; CUT; RF VCO; STM CMOS process; Wimax application; built-in self-test; circuit under test; fault coverage; radio frequency LC-voltage controlled oscillator; self-correction; size 65 nm; Built-in self-test; CMOS process; Fault detection; Feedback; Monitoring; Radio control; Radio frequency; Voltage; Voltage-controlled oscillators; WiMAX; BIST; Fault coverage; Peak-to-peak voltage detector; RF; Self-correction; VCO;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2009. ITC 2009. International

Conference_Location

Austin, TX

Print_ISBN

978-1-4244-4868-5

Electronic_ISBN

978-1-4244-4867-8

Type

conf

DOI

10.1109/TEST.2009.5355721

Filename

5355721