Title :
HFSS simulation of GTEM cell and analysis of normalized electric-field strength in EMI measurements of GTEM cell
Author :
Li, Ji ; Li, ShuFang ; Xing, Shuguang ; Kan, Runtian
Author_Institution :
Sch. of Inf. & Commun. Eng., Beijing Univ. of Posts & Telecommun., Beijing, China
Abstract :
Since the appearance of GTEM cell, recent years more and more people put emphases on using it to do EMI measurements. Many papers simulate GTEM cell using FDTD method or software based on FDTD, while this paper pick up HFSS software based on FEM to simulate GTEM cell and check the credibility of simulation from two aspects: characteristic impendence and output power of port. Besides, the normalized electric-field strength which is an important parameter in using GTEM cell to do EMI measurements is analyzed and discussed from simulation and experiments to get useful conclusions.
Keywords :
TEM cells; electric field measurement; electromagnetic interference; finite difference time-domain analysis; finite element analysis; EMI measurements; FDTD method; FEM; GTEM cell; HFSS simulation; normalized electric field strength; Analytical models; Conducting materials; Electric variables measurement; Electromagnetic interference; Finite difference methods; Power generation; Power transmission lines; TEM cells; Time domain analysis; Transmission line theory; GTEM Cell; HFSS; e0y;
Conference_Titel :
Microwave, Antenna, Propagation and EMC Technologies for Wireless Communications, 2009 3rd IEEE International Symposium on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-4076-4
DOI :
10.1109/MAPE.2009.5355737