DocumentCode
2705741
Title
A new low switching noise CMOS logic circuits for single-chip CMOS imaging system
Author
Chung, Hoon Hee ; Rhee, Jehyuk ; Joo, Youngjoong
Author_Institution
Dept. of Electr. Eng., Arizona State Univ., Tempe, AZ, USA
Volume
2
fYear
2003
fDate
22-24 Oct. 2003
Firstpage
1136
Abstract
In this paper, we present a new low switching noise CMOS logic for on-chip CMOS image sensors, which reduce the switching noise through the substrate. The instantaneous peak current in digital system is the main source of the substrate noise and the injected current noise propagates through highly doped substrate and contaminates the sensitive image sensing systems. AMI 0.5 μm CMOS technology is used for the analysis of switching noise. Simulation results show that the proposed logic generates lower ground bounce compare to the other low noise logic circuits. As a result it enables system-on-chip CMOS imaging system to be less susceptible to switching noise than when using other low noise logics.
Keywords
CMOS image sensors; integrated circuit noise; logic circuits; semiconductor device noise; 0.5 micron; injected current noise; instantaneous peak current; low noise logic circuits; low switching noise CMOS logic circuits; sensitive image sensing systems; single-chip CMOS imaging system; substrate noise; Ambient intelligence; CMOS image sensors; CMOS logic circuits; CMOS technology; Circuit noise; Circuit simulation; Digital systems; Logic circuits; Noise reduction; Switching circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
Sensors, 2003. Proceedings of IEEE
Print_ISBN
0-7803-8133-5
Type
conf
DOI
10.1109/ICSENS.2003.1279122
Filename
1279122
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