Title :
EIT 2010 preliminary program: Session 5A — Power systems electronics and applied physics
Keywords :
Curve fitting; Indexes; Logic gates; Optical noise; Optimization; Physics; Random access memory;
Conference_Titel :
Electro/Information Technology (EIT), 2010 IEEE International Conference on
Conference_Location :
Normal, IL, USA
Print_ISBN :
978-1-4244-6873-7
DOI :
10.1109/EIT.2010.5612150
