Title :
Criteria for absorber´s reflectivity lined in semi-anechoic chambers using ray-tracing technique
Author :
Naito, Yoshiyuki ; Anzai, Hiroki ; Yamazaki, Tsutomu ; Mizumoto, Tetsuya
Author_Institution :
Dept. of Phys. Electron., Tokyo Inst. of Technol., Japan
Abstract :
Semi-anechoic chambers are used for EMC measurement from 30 MHz to 1000 MHz. Criteria for absorber´s reflectivity lined in semi-anechoic chambers are discussed based on a ray-tracing analysis. The absorber´s reflectivity of -15 dB and -20 dB for normal incidence is sufficient to satisfy a standard in 3 m and 10 m measurement methods, respectively. The dimensions of the chamber can be reduced to L=8 m, W=6 m and H=5 m for the 3 m method and to L=18 m, W=13 m and H=7 m for the 10 m method
Keywords :
UHF measurement; anechoic chambers; electromagnetic compatibility; electromagnetic wave absorption; electromagnetic wave reflection; ray tracing; 10 m; 3 m; 30 to 1000 MHz; EMC measurement; UHF; VHF; absorber reflectivity; chamber dimensions; measurement methods; normal incidence; ray tracing technique; semi-anechoic chambers; transmission distance; Anechoic chambers; Attenuation; Electromagnetic compatibility; Electromagnetic scattering; Ferrites; Frequency; Impedance; Polarization; Ray tracing; Reflectivity;
Conference_Titel :
Electromagnetic Compatibility, 1996. Symposium Record. IEEE 1996 International Symposium on
Conference_Location :
Santa Clara, CA
Print_ISBN :
0-7803-3207-5
DOI :
10.1109/ISEMC.1996.561216
