DocumentCode :
2706046
Title :
Arc root commutation from moving contacts in low voltage devices
Author :
McBridge, J.W. ; Pechrach, K. ; Weaver, P.M.
Author_Institution :
Sch. of Eng. Sci., Southampton Univ., UK
fYear :
2000
fDate :
25-27 Sept. 2000
Firstpage :
130
Lastpage :
138
Abstract :
This paper focuses on the arc commutation from a moving contact and in particular on the anode motion of a high current arc in low voltage current limiting circuit breakers. Recent investigations have observed that the anode arc root motion is affected by arc chamber geometry. It was previously assumed that cathode root motion was the dominant process. The study uses a flexible test apparatus with a solid state high speed imaging system. The experimental results presented show the influence of arc chamber venting, current level, current polarity and contact velocity on arc motion, and particular emphasis is given to the anode motion. The physical process occurring in the anode root are discussed and related to the observed motion. The results show that the anode root is retarded at the tip of the moving contact and that this is primarily related to the venting process in the arc chamber.
Keywords :
circuit breakers; circuit-breaking arcs; commutation; current limiters; electric current; electrical contacts; image processing equipment; anode arc root motion; anode motion; anode root; arc chamber; arc chamber geometry; arc chamber venting; arc commutation; arc motion; arc root commutation; cathode root motion; contact velocity; current level; current polarity; flexible test apparatus; high current arc; low voltage current limiting circuit breakers; low voltage devices; moving contact; moving contact tip; moving contacts; solid state high speed imaging system; venting process; Anodes; Cathodes; Circuit breakers; Circuit faults; Circuit testing; Current limiters; Geometry; Low voltage; Optical imaging; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Contacts, 2000. Proceedings of the Forty-Sixth IEEE Holm Conference on
Conference_Location :
Chicago, IL, USA
Print_ISBN :
0-7803-5960-7
Type :
conf
DOI :
10.1109/HOLM.2000.889922
Filename :
889922
Link To Document :
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