• DocumentCode
    2706066
  • Title

    The unusual electrical erosion of high tungsten content, tungsten copper contacts switching load current in vacuum

  • Author

    Slade, Paul G. ; Li, Wangpei ; Loud, Leslie D. ; Haskins, Richard E., Jr.

  • Author_Institution
    Cutler-Hammer Inc., Horseheads, NY, USA
  • fYear
    2000
  • fDate
    25-27 Sept. 2000
  • Firstpage
    139
  • Lastpage
    152
  • Abstract
    The electrical erosion of high tungsten content, tungsten-copper (7-10 wt.% Cu) was investigated. The contacts were placed in a vacuum interrupter envelope with a background pressure of about 10/sup -6/ torr. The contacts switched one half cycle of 60 Hz current per operation. The polarity of the current was changed on each operation. Six contact pairs were investigated. Each pair was subjected to an ever-increasing number of operations: 1K, 5K, 10K, 20K, 40K, 50K and 60K. The contact erosion was inferred by measuring the linear position of the moving contact terminal. On completing the electrical testing, the vacuum interrupters were dismantled and the contact surfaces were observed. Unlike the previous work on Ag-WC (50 wt.% Ag) and Cr-Cu (75 wt.% Cu), the W-Cu contacts showed a localized build up of erosion products on the contact surfaces, even beginning at 1K operations. The experiments involved repeated switching of a unidirectional current, i.e. the contacts remained at the same polarity throughout the experiments. Here, an anode pip and a cathode crater were formed immediately. The different topographies of these contacts are discussed in terms of the metallographic analysis of the deposits on the contacts, the erosion deposits on the shields surrounding the contacts and the expansion of the vacuum arc.
  • Keywords
    copper alloys; electric current; electrical contacts; electronic equipment testing; metallography; surface topography; tungsten alloys; vacuum arcs; vacuum interrupters; wear; 0.001 mtorr; 60 Hz; Ag-WC; Cr-Cu; W-Cu; W-Cu contacts; anode pip; background pressure; cathode crater; contact erosion; contact pairs; contact polarity; contact surfaces; contact switching; contact topographies; contacts; current polarity; electrical erosion; electrical testing; erosion deposits; localized erosion product build up; metallographic analysis; moving contact terminal linear position; tungsten content; tungsten copper contacts; unidirectional current switching; vacuum arc expansion; vacuum interrupter envelope; vacuum interrupters; vacuum load current switching; Anodes; Cathodes; Contacts; Copper; Interrupters; Manufacturing; Relays; Surface topography; Tungsten; Vacuum arcs;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Contacts, 2000. Proceedings of the Forty-Sixth IEEE Holm Conference on
  • Conference_Location
    Chicago, IL, USA
  • Print_ISBN
    0-7803-5960-7
  • Type

    conf

  • DOI
    10.1109/HOLM.2000.889923
  • Filename
    889923