Title :
An economical, precise and limited access In-Circuit Test method for pulse-width modulation (PWM) circuits
Author :
Yeh, Albert ; Chou, Jesse ; Lin, Max
Author_Institution :
Test Res. Inc., Taipei, Taiwan
Abstract :
A technology is introduced that tests PWM circuits using a newly-developed single high-impedance test sensor probe versus the traditional in-circuit test (ICT) methods. Test accuracy is achieved while on-board test points and fixture probes are significantly reduced.
Keywords :
integrated circuit testing; printed circuit testing; probes; pulse width modulation; PWM circuits; high-impedance test sensor probe; in-circuit test; on-board test points; pulse width modulation circuits; Circuit testing; MOSFET circuits; Power semiconductor switches; Power supplies; Probes; Pulse circuits; Pulse width modulation; Space vector pulse width modulation; Switching circuits; Voltage;
Conference_Titel :
Test Conference, 2009. ITC 2009. International
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-4868-5
Electronic_ISBN :
978-1-4244-4867-8
DOI :
10.1109/TEST.2009.5355755
