• DocumentCode
    2706120
  • Title

    Contact current distortion due to tunnel effect

  • Author

    Takano, Eisuke

  • Author_Institution
    Sendai, Japan
  • fYear
    2000
  • fDate
    25-27 Sept. 2000
  • Firstpage
    169
  • Lastpage
    175
  • Abstract
    The third harmonic distortion ratio of the tunnel current between two electrodes separated by a thin insulating film, is evaluated by analyzing the formula derived by Simmons (J. Appl. Phys. vol. 34, no. 6, pp. 1793-803, 1963) into the Fourier series in this paper. The results show that the theoretical third harmonic distortion ratio is a function of s/spl phi//sub 0//sup 1/2/ (where s is the thickness of the film, and /spl phi//sub 0/ is the work function). The numerical evaluation results in -40 to -80 dB, when s is in the practical range of 0.4/spl sim/2.0 nm and /spl phi//sub 0/ is 1/spl sim/4 eV. Experimental results produce readings of -50 to -130 dB, when using practical contact materials (95Au-5Ni). The reasons for the discrepancy may involve the effect of the nonhomogeneous contact area, which was observed using a scanning tunneling microscope. When the contact resistance of copper with a thin insulating film is measured, the resultant small and negative thermal coefficient of contact resistance proves that tunnel resistance does exist. It is also shown that in this tunnel film, a contact deterioration caused by corrosion can clearly be detected using harmonic measurement.
  • Keywords
    Fourier series; contact resistance; corrosion; electric current; electrical contacts; electrodes; harmonic analysis; harmonic distortion; insulating thin films; numerical analysis; scanning tunnelling microscopy; tunnelling; work function; 0.4 to 2 nm; 1 to 4 eV; Au-Ni contact materials; AuNi; Cu; Cu contact resistance; Fourier series; contact current distortion; contact deterioration; corrosion; electrodes; film thickness; harmonic measurement; negative thermal coefficient of contact resistance; nonhomogeneous contact area effect; numerical evaluation; scanning tunneling microscope; thin insulating film; third harmonic distortion ratio; tunnel current; tunnel effect; tunnel film; tunnel resistance; work function; Contact resistance; Electrical resistance measurement; Electrodes; Fourier series; Harmonic analysis; Harmonic distortion; Insulation; Microscopy; Thermal resistance; Tunneling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Contacts, 2000. Proceedings of the Forty-Sixth IEEE Holm Conference on
  • Conference_Location
    Chicago, IL, USA
  • Print_ISBN
    0-7803-5960-7
  • Type

    conf

  • DOI
    10.1109/HOLM.2000.889926
  • Filename
    889926