DocumentCode
2706138
Title
Augmenting board test coverage with new intel powered opens boundary scan instruction
Author
Tee, Chwee Liong ; Tan, Tzyy Haw ; Ng, Chin Chuan
Author_Institution
Intel Corp., Kulim, Malaysia
fYear
2009
fDate
1-6 Nov. 2009
Firstpage
1
Lastpage
10
Abstract
Serious erosion of board test access demands a re-look on the current test strategy. This paper describes implementation of Extest Toggle* and its effectiveness. Note *: Extest Toggle is a design for test (DFT) method of providing a square wave at 1/2 TCK, while driving the remaining pins on the bus to a static level for guarding.
Keywords
boundary scan testing; design for testability; Extest Toggle; Intel; board test coverage; design for test method; opens boundary scan instruction; Capacitors; Circuit testing; Connectors; Costs; Design for testability; Integrated circuit interconnections; Manufacturing; Pins; Printed circuits; Technological innovation;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2009. ITC 2009. International
Conference_Location
Austin, TX
Print_ISBN
978-1-4244-4868-5
Electronic_ISBN
978-1-4244-4867-8
Type
conf
DOI
10.1109/TEST.2009.5355756
Filename
5355756
Link To Document