DocumentCode :
2706311
Title :
Influences on the length and severity of intermittences in electrical contacts
Author :
Maul, C. ; McBride, J.W. ; Swingler, J.
Author_Institution :
Sch. of Eng. Sci., Southampton Univ., UK
fYear :
2000
fDate :
25-27 Sept. 2000
Firstpage :
240
Lastpage :
246
Abstract :
This paper deals with short-duration high contact voltage-drops in static electrical contacts during fretting experiments on tin-plated terminals. The focus lies on the rate of high voltage-drop events over the fretting cycle, the maximum level of voltage-drops, the influence of current and the influence of the direction of relative movement. The parameters used for measuring the contact voltage-drop are an open circuit voltage of 14 V, a nominal current of 9 mA, 29 mA, 54 mA and 92 mA, an amplitude of fretting motion of 0.2 mm and a maximum velocity of relative movement between the contact partners of 100 /spl mu/m/s. The contact force is 500 mN+50 mN. It is shown that high voltage-drop events occur in clusters, not as isolated events. The nominal current through the contact as well as the open circuit voltage have an influence on the occurrence of these events. Two different shapes of events have been identified, suggesting different conduction mechanisms.
Keywords :
contact resistance; electric current; electrical contacts; electronic equipment testing; wear; 0.2 mm; 100 mum/s; 14 V; 29 mA; 54 mA; 9 mA; 92 mA; Sn; conduction mechanisms; contact force; contact partners; contact voltage; contact voltage-drop measurement parameters; current; electrical contacts; event shape; fretting cycle; fretting experiments; fretting motion amplitude; high voltage-drop event clusters; high voltage-drop events; intermittence length; intermittence severity; maximum voltage-drop level; open circuit voltage; relative movement direction; relative movement velocity; short-duration high contact voltage-drops; static electrical contacts; tin-plated terminals; Circuits; Contact resistance; Current measurement; Electric resistance; Electrical resistance measurement; Frequency; Mechanical engineering; Motion measurement; Time measurement; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Contacts, 2000. Proceedings of the Forty-Sixth IEEE Holm Conference on
Conference_Location :
Chicago, IL, USA
Print_ISBN :
0-7803-5960-7
Type :
conf
DOI :
10.1109/HOLM.2000.889937
Filename :
889937
Link To Document :
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