DocumentCode :
2706377
Title :
Impacts of optoelectronics technology on ULSI
Author :
Hayashi, Izuo
fYear :
1990
fDate :
7-9 June 1990
Firstpage :
23
Lastpage :
26
Abstract :
Progress in OEIC (optoelectronic integrated-circuit) technologies is briefly reviewed, and the feasibility of optically integrated ULSI is examined. It is concluded that an overall delay time of 0.1-0.2 ns will be achievable for a bus line in ULSI using optical interconnections, which is more than one order of magnitude faster than the conventional metal wire bus line. Future prospects in optoelectronics are addressed
Keywords :
VLSI; integrated circuit technology; integrated optoelectronics; optical interconnections; technological forecasting; 0.1 to 0.2 ns; OEIC; ULSI; bus line; feasibility study; optical interconnect; optical interconnections; optically integrated ULSI; optoelectronic integrated-circuit; optoelectronics technology; order of magnitude faster; overall delay time;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Circuits, 1990. Digest of Technical Papers., 1990 Symposium on
Conference_Location :
Honolulu, Hawaii, USA
Type :
conf
DOI :
10.1109/VLSIC.1990.111077
Filename :
5727511
Link To Document :
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