DocumentCode
2706480
Title
Base-emitter voltage mismatch in a pair of self-aligned bipolar transistors
Author
Sawada, Shigeki ; Nishiura, Shinji ; Manabe, Kenji
Author_Institution
Matsushita Electron. Corp., Kyoto, Japan
fYear
1990
fDate
17-18 Sep 1990
Firstpage
184
Lastpage
187
Abstract
The base-emitter voltage mismatch. ΔV BE for a pair of double polysilicon self-aligned bipolar transistors is studied. In the low emitter current range, the base peripheral effect is a dominant factor affecting ΔV BE. Since the base peripheral component caused by the lateral encroachment of the extrinsic base on the emitter region becomes important, ΔV BE increases as sidewall spacer width decreases. On the other hand, in the high current range, the emitter contact resistance is dominant and ΔV BE increases due to increased mismatch of emitter resistance
Keywords
bipolar integrated circuits; bipolar transistors; contact resistance; base peripheral effect; base-emitter voltage mismatch; double polysilicon; emitter contact resistance; emitter resistance; high current range; low emitter current range; self-aligned bipolar transistors; sidewall spacer width; Analog-digital conversion; Bipolar transistors; Boron; Contact resistance; Digital signal processing; Electrical resistance measurement; Laboratories; Large scale integration; Leakage current; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Bipolar Circuits and Technology Meeting, 1990., Proceedings of the 1990
Conference_Location
Minneapolis, MN
Type
conf
DOI
10.1109/BIPOL.1990.171158
Filename
171158
Link To Document