DocumentCode :
2706480
Title :
Base-emitter voltage mismatch in a pair of self-aligned bipolar transistors
Author :
Sawada, Shigeki ; Nishiura, Shinji ; Manabe, Kenji
Author_Institution :
Matsushita Electron. Corp., Kyoto, Japan
fYear :
1990
fDate :
17-18 Sep 1990
Firstpage :
184
Lastpage :
187
Abstract :
The base-emitter voltage mismatch. ΔVBE for a pair of double polysilicon self-aligned bipolar transistors is studied. In the low emitter current range, the base peripheral effect is a dominant factor affecting ΔVBE. Since the base peripheral component caused by the lateral encroachment of the extrinsic base on the emitter region becomes important, ΔVBE increases as sidewall spacer width decreases. On the other hand, in the high current range, the emitter contact resistance is dominant and ΔVBE increases due to increased mismatch of emitter resistance
Keywords :
bipolar integrated circuits; bipolar transistors; contact resistance; base peripheral effect; base-emitter voltage mismatch; double polysilicon; emitter contact resistance; emitter resistance; high current range; low emitter current range; self-aligned bipolar transistors; sidewall spacer width; Analog-digital conversion; Bipolar transistors; Boron; Contact resistance; Digital signal processing; Electrical resistance measurement; Laboratories; Large scale integration; Leakage current; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Bipolar Circuits and Technology Meeting, 1990., Proceedings of the 1990
Conference_Location :
Minneapolis, MN
Type :
conf
DOI :
10.1109/BIPOL.1990.171158
Filename :
171158
Link To Document :
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