• DocumentCode
    2706480
  • Title

    Base-emitter voltage mismatch in a pair of self-aligned bipolar transistors

  • Author

    Sawada, Shigeki ; Nishiura, Shinji ; Manabe, Kenji

  • Author_Institution
    Matsushita Electron. Corp., Kyoto, Japan
  • fYear
    1990
  • fDate
    17-18 Sep 1990
  • Firstpage
    184
  • Lastpage
    187
  • Abstract
    The base-emitter voltage mismatch. ΔVBE for a pair of double polysilicon self-aligned bipolar transistors is studied. In the low emitter current range, the base peripheral effect is a dominant factor affecting ΔVBE. Since the base peripheral component caused by the lateral encroachment of the extrinsic base on the emitter region becomes important, ΔVBE increases as sidewall spacer width decreases. On the other hand, in the high current range, the emitter contact resistance is dominant and ΔVBE increases due to increased mismatch of emitter resistance
  • Keywords
    bipolar integrated circuits; bipolar transistors; contact resistance; base peripheral effect; base-emitter voltage mismatch; double polysilicon; emitter contact resistance; emitter resistance; high current range; low emitter current range; self-aligned bipolar transistors; sidewall spacer width; Analog-digital conversion; Bipolar transistors; Boron; Contact resistance; Digital signal processing; Electrical resistance measurement; Laboratories; Large scale integration; Leakage current; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Bipolar Circuits and Technology Meeting, 1990., Proceedings of the 1990
  • Conference_Location
    Minneapolis, MN
  • Type

    conf

  • DOI
    10.1109/BIPOL.1990.171158
  • Filename
    171158