DocumentCode :
270665
Title :
Improving fast S-parameter convolution by optimising reference impedance
Author :
Goh, P. ; Schutt-Ainé, J.E.
Author_Institution :
Sch. of Electr. & Electron. Eng., Univ. Sains Malaysia, Nibong Tebal, Malaysia
Volume :
50
Issue :
18
fYear :
2014
fDate :
August 28 2014
Firstpage :
1290
Lastpage :
1292
Abstract :
A method to perform fast transient simulations of interconnects by modelling the impulse responses of the S-parameters as discrete impulses, and then retaining only those with significant magnitudes has recently been shown to be faster than the present state-of-the-art method of curve fitting to a rational function model. An improvement to the fast convolution method by first optimising the choice of reference impedance used in the dataset is proposed. The method is seen to yield computational savings while retaining the accuracy.
Keywords :
convolution; curve fitting; interconnections; rational functions; transient response; curve fitting; discrete impulse response; fast S-parameter convolution; fast convolution method; fast transient simulation; interconnection; rational function model; reference impedance optimisation;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el.2014.1498
Filename :
6888567
Link To Document :
بازگشت