• DocumentCode
    2706695
  • Title

    Analysis of the effect of ferrite tile gap on EMC chamber having ferrite absorber walls

  • Author

    Liu, Kefeng

  • Author_Institution
    EMC Test Systems, Austin, TX, USA
  • fYear
    1996
  • fDate
    19-23 Aug 1996
  • Firstpage
    156
  • Lastpage
    161
  • Abstract
    It has been known that air gaps between ferrite tiles degrade the absorbing performance of the tile absorber wall installation. However, analysis of the effect has not been thoroughly well published. This paper presents two techniques to analyze gaps between ferrite tiles. A simplified magnetic circuit method is introduced to calculate the effective permeability of the tile wall with gaps. Then, a two-dimensional finite element method is used to analyze the same gap model to validate the simplified formula. The air gap formula is then incorporated into characterizing the ferrite tile absorber with or without a dielectric absorber as its matching element. The fully characterized ferrite absorbers can then be used to design EMC chambers. Design examples are, presented to demonstrate the correlation between calculated and measured normalized site attenuations for 10 m/3 m EMC semi-anechoic chambers
  • Keywords
    anechoic chambers; attenuation measurement; electromagnetic compatibility; electromagnetic wave absorption; ferrites; finite element analysis; magnetic circuits; permeability; 10 m; 3 m; EMC chamber design; EMC measurements; EMC semianechoic chambers; absorbing performance; air gap formula; calculated normalized site attenuation; correlation; dielectric absorber; effective permeability; ferrite absorber walls; ferrite tile gap; gap model; magnetic circuit method; matching element; measured normalized site attenuation; tile absorber wall installation; two-dimensional finite element method; Air gaps; Degradation; Dielectrics; Electromagnetic compatibility; Ferrites; Finite element methods; Magnetic analysis; Magnetic circuits; Permeability; Tiles;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 1996. Symposium Record. IEEE 1996 International Symposium on
  • Conference_Location
    Santa Clara, CA
  • Print_ISBN
    0-7803-3207-5
  • Type

    conf

  • DOI
    10.1109/ISEMC.1996.561220
  • Filename
    561220