A Method to Improve the Radiation Patterns of the Base-Station Sector Antenna for Mobile Communications by Adding Scattering Structures on the Front Panel of the Antenna

Author

Wu, Cheng-Hsiung ; Yang, Chang-Fa ; Wang, Te-Shun ; Liao, Kuan-Chi ; Chen, Yen-Ming

Author_Institution

Dept. of Electr. Eng., Nat. Taiwan Sci. & Technol. Univ., Taipei

fYear

2006

fDate

9-14 July 2006

Firstpage

4357

Lastpage

4360

Abstract

A finite difference time domain software package, called XFDTD, is applied to study the characteristics of the base-station sector antennas for mobile communications. The XFDTD simulation software was employed to design several different metal structures for the scattering surfaces, located on the front panels of the base-station antennas. Without varying the appearance and dimensions of the antennas, the scattering surfaces can improve the antenna radiation patterns, such as lowering the level of the back lobe, reducing the field intensity in regions not to be covered, and decreasing the beamwidth of the antenna in the horizontal plane. Thus, cochannel and adjacent-channel interferences can be mitigated and antenna performance may be improved

Keywords

adjacent channel interference; antenna radiation patterns; broadband antennas; broadband networks; cochannel interference; code division multiple access; electromagnetic wave scattering; finite difference time-domain analysis; mobile antennas; mobile radio; XFDTD; adjacent-channel interferences; antenna beamwidth; antenna front panel; antenna radiation patterns; base-station sector antenna; cochannel interferences; field intensity; finite difference time domain software package; mobile communications; scattering structures; scattering surfaces; Antenna measurements; Antenna radiation patterns; Antenna theory; Brain modeling; Electromagnetic scattering; Finite difference methods; Interference; Mobile antennas; Mobile communication; Multiaccess communication;

fLanguage

English

Publisher

ieee

Conference_Titel

Antennas and Propagation Society International Symposium 2006, IEEE

Conference_Location

Albuquerque, NM

Print_ISBN

1-4244-0123-2

Type

conf

DOI

10.1109/APS.2006.1711597

Filename

1711597