DocumentCode :
2706849
Title :
Statistical analysis of area and volume effects on breakdown voltage in liquid nitrogen using Weibull distribution
Author :
Goshima, H. ; Hayakawa, N. ; Hikita, M. ; Uchida, K. ; Okubo, H.
Author_Institution :
Nagoya Univ., Japan
fYear :
1994
fDate :
5-8 Jun 1994
Firstpage :
430
Lastpage :
433
Abstract :
We measured breakdown voltage in liquid nitrogen (LN2) with sphere to plane electrode and coaxial cylindrical electrode configurations, and discussed them with stressed electrode area (SEA) and/or stressed liquid volume (SLV). We also carried out statistical analysis of the results using Weibull distribution to examine the area and volume effects on breakdown voltage in LN2. The dc and ac breakdown strength in LN2 decreased to 1/4~1/5 with increasing the SSEA (statistical stressed electrode area) and SSLV (statistical stressed liquid volume). These results permitted us to confirm that the area and volume effects definitely determined the dc and ac breakdown strength in LN2. Next, Weibull shape parameter m for sphere to plane and coaxial cylindrical electrodes were estimated to be about 6~8 and 11~13, respectively. The results of the Weibull statistics were compared with the conventional concept of the SEA or SLV. Consequently, SSEA or SSLV was found to be nearly equal to 80~85% of SEA or SLV. This result indicates that at least 80~85% of the maximum electric field strength should be considered for the insulation design in LN2 when the area and volume effects are involved
Keywords :
Weibull distribution; cryogenic electronics; electric breakdown; electric strength; nitrogen; voltage measurement; N2; Weibull distribution; ac breakdown strength; area effects; breakdown voltage; coaxial cylindrical electrode; dc breakdown strength; liquid nitrogen; sphere to plane electrode; statistical analysis; statistical stressed electrode area; statistical stressed liquid volume; stressed electrode area; stressed liquid volume; superconducting power systems; volume effects; Area measurement; Coaxial components; Electric breakdown; Electrodes; Nitrogen; Sea measurements; Statistical analysis; Stress measurement; Voltage measurement; Volume measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation, 1994., Conference Record of the 1994 IEEE International Symposium on
Conference_Location :
Pittsburgh, PA
ISSN :
1089-084X
Print_ISBN :
0-7803-1942-7
Type :
conf
DOI :
10.1109/ELINSL.1994.401427
Filename :
401427
Link To Document :
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