• DocumentCode
    2707212
  • Title

    A 0.13μm hardware-efficient probabilistic-based noise-tolerant circuit design and implementation with 24.5dB noise-immunity improvement

  • Author

    I-Chyn Wey ; You-Gang Chen ; Changhong Yu ; Jie Chen ; An-Yeu Wu

  • Author_Institution
    Nat. Taiwan Univ., Taipei
  • fYear
    2007
  • fDate
    12-14 Nov. 2007
  • Firstpage
    316
  • Lastpage
    319
  • Abstract
    As the size of CMOS devices is scaled down to the nanoscale level, noise interferences start to significantly affect the VLSI circuit performance. Because the noise is random and dynamic in nature, a probabilistic-based approach is more suitable to handle signal errors than the conventional deterministic circuit designs. However, probabilistic-based designs cost larger hardware area. In this paper, we design and implement a hardware-efficient probabilistic-based noise-tolerant circuit, an 8-bit Markov random field carry lookahead adder (MRF_CLA), in 0.13 mum CMOS process technology. The measurement results show that the proposed MRF_CLA can provide 24.5 dB of noise-immunity enhancement as compared with its conventional CMOS design. Moreover, the transistor count can be saved 42% as compared to the state-of-art MRF design [1].
  • Keywords
    CMOS logic circuits; Markov processes; adders; carry logic; integrated circuit noise; interference suppression; CMOS devices; CMOS process; Markov random field carry lookahead adder; VLSI circuit; hardware-efficient probabilistic-based noise-tolerant circuit; nanoscale level design; noise interference; noise-immunity improvement; probabilistic-based noise-tolerant circuit design; size 0.13 mum; word length 8 bit; Circuit noise; Circuit optimization; Circuit synthesis; Costs; Hardware; Interference; Markov random fields; Nanoscale devices; Noise level; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference, 2007. ASSCC '07. IEEE Asian
  • Conference_Location
    Jeju
  • Print_ISBN
    978-1-4244-1359-1
  • Type

    conf

  • DOI
    10.1109/ASSCC.2007.4425694
  • Filename
    4425694