Title :
Single Electron Fault in QCA Inverter Gate
Author :
Mahdavi, Mojdeh ; Amiri, Mohammad Amin ; Mirzakuchaki, Sattar ; Moghaddasi, Mohammad Naser
Author_Institution :
Islamic Azad Univ., Shahr-e-Qods, Iran
Abstract :
Quantum Cellular Automata (QCA) represents an emerging technology at the nanotechnology level. There are various faults which may occur in QCA cells. One of these faults is the Single Electron Fault (SEF) that can happen during manufacturing or operation of QCA circuits. A detailed simulation based logic level modeling of Single Electron Fault for QCA Inverter gate is represented in this paper.
Keywords :
Circuit faults; Electrons; Energy consumption; Inverters; Manufacturing; Nanotechnology; Quantum cellular automata; Quantum dots; Quantum mechanics; Stationary state; QCA; Single Electron Fault;
Conference_Titel :
MEMS, NANO, and Smart Systems (ICMENS), 2009 Fifth International Conference on
Conference_Location :
Dubai, United Arab Emirates
Print_ISBN :
978-0-7695-3938-6
Electronic_ISBN :
978-1-4244-5616-1
DOI :
10.1109/ICMENS.2009.23
