Abstract :
The constant demand for analog functions in ICs and SOCs, contrasted with the improving efficiency of testing digital functions implemented with automated design-for-test (DFT) methods, is increasing the demand for analog DFT to facilitate faster, lower cost, analog testing. Most analog DFT solutions are ad-hoc and specific to each company or product, and there is very little, if any, commercially available analog DFT automation. This panel explored whether and where the EDA industry could improve DFT and testing of analog functions.
Keywords :
analogue integrated circuits; design for testability; electronic design automation; integrated circuit testing; system-on-chip; EDA; IC; SOC; analog design-for-test; analog functions; automated design-for-test methods; digital function testing; Circuit noise; Computer errors; Debugging; Electronic design automation and methodology; Error analysis; Integrated circuit interconnections; Logic; Signal design; Signal processing; Testing;
