DocumentCode
2707743
Title
Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476)
fYear
2000
fDate
26-28 Sept. 2000
Abstract
Presents the front cover and table of contents to the Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476).
Keywords
BiCMOS integrated circuits; CMOS integrated circuits; electrostatic discharge; magnetic recording; standards; BiCMOS; CMOS; circuits; factory issues; magnetic recording; materials; standards; systems;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000
Conference_Location
Anaheim, CA, USA
Print_ISBN
1-58537-018-5
Type
conf
DOI
10.1109/EOSESD.2000.890020
Filename
890020
Link To Document