Title :
Automatic diagnostic tool for Analog-Mixed Signal and RF load boards
Author :
Kannan, Sukeshwar ; Kim, Bruce C.
Author_Institution :
Univ. of Alabama, Tuscaloosa, AL, USA
Abstract :
This paper describes a low cost test technique for testing Analog-Mixed Signal and RF load boards used in ATE (Automatic Test Equipment). The paper describes the development and application of a software tool for automatic analysis and test generation for mixed signal and RF circuits on Device Interface Boards (DIB). DIBs are essential components for testing ICs and they contain mixed-signal and RF circuits with several active and passive components that are needed to simulate test conditions for ICs. The software tool utilizes the schematic information of DIBs to generate tests for components and interconnectivity on the DIB. The tests generated are dependent upon the accessibility and programmability provided by the test hardware as well as the testability provided by DIB design. The output of the tool is a generic test specification that is independent of test hardware platform. Automatic test generation saves on the manual labor for writing DIB tests and thus contributing to the reduction of time to market for ICs.
Keywords :
MMIC; automatic test pattern generation; automatic test software; design for testability; electronic engineering computing; integrated circuit testing; mixed analogue-digital integrated circuits; radiofrequency integrated circuits; ATE; RF circuits; RF load boards; accessibility; analog-mixed signal boards; automatic analysis; automatic diagnostic tool; automatic test equipment; automatic test generation; device interface boards; interconnectivity; mixed signal circuits; programmability; software tool; testability; Application software; Automatic test equipment; Automatic testing; Circuit testing; Costs; Hardware; RF signals; Radio frequency; Software testing; Software tools;
Conference_Titel :
Test Conference, 2009. ITC 2009. International
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-4868-5
Electronic_ISBN :
978-1-4244-4867-8
DOI :
10.1109/TEST.2009.5355836
