DocumentCode :
2707790
Title :
Dielectrometry measurements of moisture dynamics in oil-impregnated pressboard
Author :
Sheiretov, Y. ; Zahn, M.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., MIT, Cambridge, MA, USA
fYear :
1994
fDate :
5-8 Jun 1994
Firstpage :
33
Lastpage :
36
Abstract :
The dielectric spectrum of pressboard, (i.e. its complex permittivity as a function of frequency), is related to its moisture content and to its temperature. Consequently it is possible to use dielectrometry measurements to measure a pressboard sample´s moisture content. The complex permittivity of pressboard is measured in two different ways. The first method places the sample between two parallel metal plates, in effect creating a lossy lumped capacitor, whose complex impedance can easily be measured. The complex permittivity thus calculated is effectively averaged across the sample´s bulk. The other method involves interdigitated electrodes, applied only to one surface of the sample. Since the electric field´s depth of penetration is dependent on the spatial wavelength of the electrodes, different sensors can obtain information from different depths in the material, making it possible to measure spatial distributions of the dielectric properties. This can allow the study of the diffusion of water in pressboard
Keywords :
dielectric measurement; insulation testing; moisture measurement; power transformer insulation; power transformer testing; static electrification; transformer oil; complex permittivity; depth of penetration; dielectrometry measurements; interdigitated electrodes; lossy lumped capacitor; moisture content; moisture dynamics; oil-impregnated pressboard; parallel metal plates; spatial distributions; spatial wavelength; Capacitors; Dielectric measurements; Electrodes; Frequency; Impedance measurement; Moisture measurement; Permittivity measurement; Surface impedance; Temperature; Wavelength measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation, 1994., Conference Record of the 1994 IEEE International Symposium on
Conference_Location :
Pittsburgh, PA
ISSN :
1089-084X
Print_ISBN :
0-7803-1942-7
Type :
conf
DOI :
10.1109/ELINSL.1994.401474
Filename :
401474
Link To Document :
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