Title :
What is IEEE P1149.8.1 and why?
Author :
Parker, Ken ; Burgess, Jeff
Abstract :
This poster will provide a high-level description of IEEE P1149.8.1 and the manufacturing board test problem set it addresses. The poster will serve as a follow on to a paper (Session 2.1) which will be presented earlier in the conference. The principal goal of the poster is to raise awareness (and participation) for the developing standard.
Keywords :
IEEE standards; boundary scan testing; circuit testing; IEEE P1149.8.1; manufacturing board test problem; Connectors; Latches; Manufacturing; Measurement techniques; Probes; Signal generators; Sockets; Standards development; Test equipment; Testing;
Conference_Titel :
Test Conference, 2009. ITC 2009. International
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-4868-5
Electronic_ISBN :
978-1-4244-4867-8
DOI :
10.1109/TEST.2009.5355837
