• DocumentCode
    2707793
  • Title

    What is IEEE P1149.8.1 and why?

  • Author

    Parker, Ken ; Burgess, Jeff

  • fYear
    2009
  • fDate
    1-6 Nov. 2009
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    This poster will provide a high-level description of IEEE P1149.8.1 and the manufacturing board test problem set it addresses. The poster will serve as a follow on to a paper (Session 2.1) which will be presented earlier in the conference. The principal goal of the poster is to raise awareness (and participation) for the developing standard.
  • Keywords
    IEEE standards; boundary scan testing; circuit testing; IEEE P1149.8.1; manufacturing board test problem; Connectors; Latches; Manufacturing; Measurement techniques; Probes; Signal generators; Sockets; Standards development; Test equipment; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2009. ITC 2009. International
  • Conference_Location
    Austin, TX
  • Print_ISBN
    978-1-4244-4868-5
  • Electronic_ISBN
    978-1-4244-4867-8
  • Type

    conf

  • DOI
    10.1109/TEST.2009.5355837
  • Filename
    5355837
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2707793