DocumentCode
2707847
Title
Transient formulation of lossy ground return parameters for time-domain transmission line analysis
Author
Amore, M.D. ; Sarto, M.S.
Author_Institution
Dipt. di Energia Elettrica, Rome Univ., Italy
fYear
1996
fDate
19-23 Aug 1996
Firstpage
213
Lastpage
218
Abstract
New expressions of the ground impedance and admittance matrices for multiconductor line simulation are proposed, which are valid in a wide frequency-range. The time-domain formulation of the ground return parameters is obtained analytically by the inverse Fourier transform, based on the rational approximation in the frequency-domain. In the time-domain telegraphers´ equations the convolution terms including the transient ground parameters are rearranged in order to achieve a more efficient implementation in numerical solution codes. The sensitivity of the proposed model to the ground conductivity and line geometrical parameters is investigated with reference to a three-conductor line. Comparisons with the results obtained by using the Carson ground impedances are carried out
Keywords
Fourier transforms; convolution; digital simulation; electric admittance; electric impedance; frequency-domain analysis; inverse problems; simulation; time-domain analysis; transient analysis; transmission line matrix methods; admittance matrices; convolution terms; frequency-domain analysis; ground conductivity; ground impedance matrices; inverse Fourier transform; line geometrical parameters; lossy ground return parameters; multiconductor line simulation; numerical solution codes; rational approximation; sensitivity; three-conductor line; time-domain formulation; time-domain telegraphers´ equations; time-domain transmission line analysis; transient ground parameters; Admittance; Conductivity; Equations; Impedance; Power system transients; Propagation losses; Time domain analysis; Transient analysis; Transmission line matrix methods; Transmission lines;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility, 1996. Symposium Record. IEEE 1996 International Symposium on
Conference_Location
Santa Clara, CA
Print_ISBN
0-7803-3207-5
Type
conf
DOI
10.1109/ISEMC.1996.561231
Filename
561231
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