• DocumentCode
    2707983
  • Title

    Controlling ESD and cleanliness by using new thermoplastic compounds for injection molded and corrugated packaging products

  • Author

    Narkis, Moshe ; Lidor, Gershon ; Vaxman, Anita ; Zuri, Limor

  • Author_Institution
    Dept. of Chem. Eng., Technion-Israel Inst. of Technol., Haifa, Israel
  • fYear
    2000
  • fDate
    26-28 Sept. 2000
  • Firstpage
    139
  • Lastpage
    151
  • Abstract
    New static dissipative thermoplastic materials for injection molding and corrugated packaging have been recently developed based on the selective localization of carbon black in a multi-component system. This paper analyses the cleanroom compatibility of these new compounds with consistent resistivities within the desired static dissipative range (10/sup 6/-10/sup 9/ /spl Omega//sq) achieved with very low carbon black loadings (less than 2 wt%). The goals were to obtain an understanding of the various materials´ performance with regards to ESD and cleanliness. Ionic contamination, outgassing, nonvolatile residues and electrical properties are the main topics addressed.
  • Keywords
    clean rooms; conducting polymers; electrical resistivity; electrostatic discharge; filled polymers; moulding; plastic packaging; protection; surface contamination; C; ESD; ESD control; carbon black loading; cleanliness; cleanliness control; cleanroom compatibility; corrugated packaging; corrugated packaging products; electrical properties; injection molded packaging products; injection molding; ionic contamination; material performance; multi-component system; nonvolatile residues; outgassing; resistivity; selective carbon black localization; static dissipative range; static dissipative thermoplastic materials; thermoplastic compounds; Carbon compounds; Conducting materials; Conductivity; Electronic components; Electrostatic discharge; Organic materials; Packaging; Polymers; Protection; Surface contamination;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000
  • Conference_Location
    Anaheim, CA, USA
  • Print_ISBN
    1-58537-018-5
  • Type

    conf

  • DOI
    10.1109/EOSESD.2000.890037
  • Filename
    890037