Advances in magneto optical static event detector technology

Author

Jacksen, Niels ; Nelsen, Lyle ; Boehm, Donald ; Odom, Tom

Author_Institution

ExMod Corp., San Jose, CA, USA

fYear

2000

fDate

26-28 Sept. 2000

Firstpage

193

Lastpage

201

Abstract

Magneto-optic static event detectors, introduced at the 1998 EOS/ESD Symposium, have been demonstrated as a useful tool to detect low level transients that damage MR and GMR heads. Improvements in magneto-optic film characteristics, device design, and wafer fabrication methods will result in enhanced sensitivities to those transients. Improvements in packaging and performance repeatability are described.

Keywords

electric sensing devices; electric variables measurement; electrostatic discharge; giant magnetoresistance; magnetic heads; magneto-optical sensors; magnetoresistive devices; packaging; transient analysis; GMR head damage; MR head damage; device design; low level transients; magneto optical static event detector technology; magneto-optic film characteristics; magneto-optic static event detectors; packaging; performance repeatability; transient sensitivity; wafer fabrication methods; Earth Observing System; Electrostatic discharge; Event detection; Magnetic heads; Magnetooptic devices; Optical detectors; Optical device fabrication; Optical films; Optical sensors; Packaging;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000

Conference_Location

Anaheim, CA, USA

Print_ISBN

1-58537-018-5

Type

conf

DOI

10.1109/EOSESD.2000.890045

Filename

890045