DocumentCode :
2708083
Title :
Advances in magneto optical static event detector technology
Author :
Jacksen, Niels ; Nelsen, Lyle ; Boehm, Donald ; Odom, Tom
Author_Institution :
ExMod Corp., San Jose, CA, USA
fYear :
2000
fDate :
26-28 Sept. 2000
Firstpage :
193
Lastpage :
201
Abstract :
Magneto-optic static event detectors, introduced at the 1998 EOS/ESD Symposium, have been demonstrated as a useful tool to detect low level transients that damage MR and GMR heads. Improvements in magneto-optic film characteristics, device design, and wafer fabrication methods will result in enhanced sensitivities to those transients. Improvements in packaging and performance repeatability are described.
Keywords :
electric sensing devices; electric variables measurement; electrostatic discharge; giant magnetoresistance; magnetic heads; magneto-optical sensors; magnetoresistive devices; packaging; transient analysis; GMR head damage; MR head damage; device design; low level transients; magneto optical static event detector technology; magneto-optic film characteristics; magneto-optic static event detectors; packaging; performance repeatability; transient sensitivity; wafer fabrication methods; Earth Observing System; Electrostatic discharge; Event detection; Magnetic heads; Magnetooptic devices; Optical detectors; Optical device fabrication; Optical films; Optical sensors; Packaging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000
Conference_Location :
Anaheim, CA, USA
Print_ISBN :
1-58537-018-5
Type :
conf
DOI :
10.1109/EOSESD.2000.890045
Filename :
890045
Link To Document :
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