Title :
A 250-MHz 1-Mbit embedded MRAM macro using 2T1MTJ cell with bitline separation and half-pitch shift architecture
Author :
Sakimura, Noboru ; Sugibayashi, Tadahiko ; Nebashi, Ryusuke ; Honjo, Hiroaki ; Saito, Shinsaku ; Kato, Yuko ; Kasai, Naoki
Author_Institution :
NEC Corp., Sagamihara
Abstract :
A 250-MHz 1-Mbit MRAM macro is demonstrated in a 0.15-mum standard CMOS process with 1.5-V supply. Its clock frequency is the highest among the MRAMs that have been reported. It has a highly compatible embedded-SRAM interface. The macro is designed using a 6.97-mum2 bitline separated and half-pitch shifted 2-transistor 1-magnetic tunnel junction (2T1MTJ) cell. The half-pitch-shift arrangement enables efficient reduction of bitline capacitance and a symmetrical reading scheme, which accelerates the random access clock frequency to the same speed as that of SRAMs. The technology will help to achieve MRAM embedded systems on chips (SoCs).
Keywords :
CMOS memory circuits; embedded systems; random-access storage; CMOS process; MRAM embedded systems on chip; bitline capacitance; complementary metal-oxide-semiconductor; embedded-SRAM interface; frequency 250 MHz; half-pitch-shift arrangement; random access clock frequency; size 0.15 micron; symmetrical reading scheme; voltage 1.5 V; Acceleration; Capacitance; Clocks; Driver circuits; Frequency; Nonvolatile memory; Random access memory; Solid state circuits; Voltage; Writing;
Conference_Titel :
Solid-State Circuits Conference, 2007. ASSCC '07. IEEE Asian
Conference_Location :
Jeju
Print_ISBN :
978-1-4244-1359-1
Electronic_ISBN :
978-1-4244-1360-7
DOI :
10.1109/ASSCC.2007.4425769