Title :
Baseline popping of spin-valve recording heads induced by ESD
Author :
Shen, Yong ; Leung, Ringo ; Sun, Jennifer ZF
Author_Institution :
SAE Magnetics (HK) Ltd., Kwai Chung, China
Abstract :
We report a novel mechanism of baseline popping (BLP) of spin-valve (SV) magnetic recording heads induced by machine model (MM) ESD, which is characterized by short transient time (10-20 ns) and high peak current (25-35 mA). Energy required for the phenomenon is just 0.2-0.3 nJ which is significantly less than that required for pinned layer reversal induced by human body model (HBM) ESD (Takahashi et al., 1998). Our data shows that this magnetic instability is caused by a change in the magnetization state of the permanent magnetic layer near track edges and can be eliminated by magnetic field re-initialization.
Keywords :
electric current; electronic equipment testing; magnetic heads; magnetic recording; magnetic thin films; magnetisation; permanent magnets; reliability; spin valves; stability; 0.2 to 0.3 nJ; 10 to 20 ns; 25 to 35 mA; ESD; HBM ESD; MM ESD; MM ESD energy; SV magnetic recording heads; baseline popping; human body model ESD; machine model ESD; magnetic field re-initialization; magnetic instability; magnetization state; peak current; permanent magnetic layer; pinned layer reversal; spin-valve recording heads; track edges; transient time; Capacitors; Circuit simulation; Circuit testing; Degradation; Electrostatic discharge; Magnetic heads; Magnetic recording; Magnetic sensors; Magnetization; Threshold voltage;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000
Conference_Location :
Anaheim, CA, USA
Print_ISBN :
1-58537-018-5
DOI :
10.1109/EOSESD.2000.890100
