Baseline popping of spin-valve recording heads induced by ESD

Author

Shen, Yong ; Leung, Ringo ; Sun, Jennifer ZF

Author_Institution

SAE Magnetics (HK) Ltd., Kwai Chung, China

fYear

2000

fDate

26-28 Sept. 2000

Firstpage

355

Lastpage

359

Abstract

We report a novel mechanism of baseline popping (BLP) of spin-valve (SV) magnetic recording heads induced by machine model (MM) ESD, which is characterized by short transient time (10-20 ns) and high peak current (25-35 mA). Energy required for the phenomenon is just 0.2-0.3 nJ which is significantly less than that required for pinned layer reversal induced by human body model (HBM) ESD (Takahashi et al., 1998). Our data shows that this magnetic instability is caused by a change in the magnetization state of the permanent magnetic layer near track edges and can be eliminated by magnetic field re-initialization.

Keywords

electric current; electronic equipment testing; magnetic heads; magnetic recording; magnetic thin films; magnetisation; permanent magnets; reliability; spin valves; stability; 0.2 to 0.3 nJ; 10 to 20 ns; 25 to 35 mA; ESD; HBM ESD; MM ESD; MM ESD energy; SV magnetic recording heads; baseline popping; human body model ESD; machine model ESD; magnetic field re-initialization; magnetic instability; magnetization state; peak current; permanent magnetic layer; pinned layer reversal; spin-valve recording heads; track edges; transient time; Capacitors; Circuit simulation; Circuit testing; Degradation; Electrostatic discharge; Magnetic heads; Magnetic recording; Magnetic sensors; Magnetization; Threshold voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000

Conference_Location

Anaheim, CA, USA

Print_ISBN

1-58537-018-5

Type

conf

DOI

10.1109/EOSESD.2000.890100

Filename

890100