Title :
Switching and leakage power modeling for multiple-supply dynamic gate with delay constraining based on wavelet neural networks
Author :
Wang, J. ; Wu, W. ; Gong, N. ; Zuo, L. ; Hou, L. ; Geng, S. ; Zhang, W. ; Gao, D.
Author_Institution :
VLSI & Syst. Lab., Beijing Univ. of Technol., Beijing, China
Abstract :
A model for forecasting the switching power, leakage power and delay of the multiple-supply dynamic OR gates based on wavelet neural networks in 45 nm technology is proposed. By studying the impact of the multiple-supply technique (MST) on the power and delay characteristics, the proposed forecasting model could forecast the nonlinear changing of the switching power, leakage power and delay of the different inputs dynamic OR gates with fast speed convergence and high precision. At last, the trend of the forecasting curve is discussed.
Keywords :
logic gates; neural nets; switching circuits; wavelet transforms; leakage power modeling; multiple-supply dynamic OR gates; size 45 nm; switching power; wavelet neural network; CMOS technology; Circuits; Clocks; Delay effects; Neural networks; Portable computers; Predictive models; Propagation delay; Technology forecasting; Threshold voltage;
Conference_Titel :
Neural Networks, 2009. IJCNN 2009. International Joint Conference on
Conference_Location :
Atlanta, GA
Print_ISBN :
978-1-4244-3548-7
Electronic_ISBN :
1098-7576
DOI :
10.1109/IJCNN.2009.5178734