Title :
Paired Learners for Concept Drift
Author :
Bach, Stephen H. ; Maloof, Marcus A.
Author_Institution :
Dept. of Comput. Sci., Georgetown Univ., Washington, DC
Abstract :
To cope with concept drift, we paired a stable online learner with a reactive one. A stable learner predicts based on all of its experience, whereas are active learner predicts based on its experience over a short, recent window of time. The method of paired learning uses differences in accuracy between the two learners over this window to determine when to replace the current stable learner, since the stable learner performs worse than does there active learner when the target concept changes. While the method uses the reactive learner as an indicator of drift, it uses the stable learner to predict, since the stable learner performs better than does the reactive learner when acquiring target concept. Experimental results support these assertions. We evaluated the method by making direct comparisons to dynamic weighted majority, accuracy weighted ensemble, and streaming ensemble algorithm (SEA) using two synthetic problems, the Stagger concepts and the SEA concepts, and three real-world data sets: meeting scheduling, electricity prediction, and malware detection. Results suggest that, on these problems, paired learners outperformed or performed comparably to methods more costly in time and space.
Keywords :
invasive software; learning (artificial intelligence); scheduling; Stagger concepts; accuracy weighted ensemble; active learner; concept drift; dynamic weighted majority; electricity prediction; malware detection; online learner; paired learners; reactive learner; real-world data sets; scheduling; streaming ensemble algorithm; Algorithm design and analysis; Computer science; Data mining; Dynamic scheduling; Heuristic algorithms; Scheduling algorithm; Stability; USA Councils; concept drift; online learning; time-changing data streams;
Conference_Titel :
Data Mining, 2008. ICDM '08. Eighth IEEE International Conference on
Conference_Location :
Pisa
Print_ISBN :
978-0-7695-3502-9
DOI :
10.1109/ICDM.2008.119