Title :
THz spectroscopy of ceramic and polycrystalline materials for characterization of microwave dielectric properties
Author :
Siegrist, K.M. ; Plusquellic, D.F. ; Thomas, M.E.
Author_Institution :
Johns Hopkins Univ., Laurel, MD, USA
Abstract :
Theoretically expected frequency and temperature dependence of weak multiphonon bands at the far infrared absorption band edge are used to develop classical oscillator models of permittivity for several window materials (sapphire, ZnS and Pyroceram® 9606) which accurately model dielectric behavior from the infrared through the THz and into the microwave regions.
Keywords :
II-VI semiconductors; ceramics; infrared spectra; permittivity; sapphire; terahertz spectroscopy; wide band gap semiconductors; zinc compounds; Al2O3; Pyroceram 9606; THz spectroscopy; ZnS; ceramic materials; far infrared absorption band edge; microwave dielectric properties; oscillator models; permittivity; polycrystalline materials; sapphire; weak multiphonon bands; window materials; Absorption; Dielectrics; Materials; Microwave oscillators; Microwave theory and techniques; Temperature dependence;
Conference_Titel :
Infrared Millimeter and Terahertz Waves (IRMMW-THz), 2010 35th International Conference on
Conference_Location :
Rome
Print_ISBN :
978-1-4244-6655-9
DOI :
10.1109/ICIMW.2010.5612366
