Title :
Non-invasive RF built-in testing using on-chip temperature sensors
Author :
Aldrete, E. ; Onabajo, M. ; Altet, J. ; Mateo, D. ; Silva-Martinez, J.
Author_Institution :
Univ. Politec. de Catalunya, Barcelona, Spain
Abstract :
This poster shows how to efficiently observe high-frequency figures of merit in RF circuits by measuring DC temperature with CMOS-compatible built-in sensors.
Keywords :
CMOS integrated circuits; built-in self test; temperature sensors; CMOS; DC temperature; noninvasive RF built-in testing; on-chip temperature sensors; Circuit testing; Coupling circuits; Detectors; Frequency measurement; Monitoring; Performance evaluation; Radio frequency; Temperature measurement; Temperature sensors; Transceivers;
Conference_Titel :
Test Conference, 2009. ITC 2009. International
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-4868-5
Electronic_ISBN :
978-1-4244-4867-8
DOI :
10.1109/TEST.2009.5355901
