• DocumentCode
    2708969
  • Title

    Non-invasive RF built-in testing using on-chip temperature sensors

  • Author

    Aldrete, E. ; Onabajo, M. ; Altet, J. ; Mateo, D. ; Silva-Martinez, J.

  • Author_Institution
    Univ. Politec. de Catalunya, Barcelona, Spain
  • fYear
    2009
  • fDate
    1-6 Nov. 2009
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    This poster shows how to efficiently observe high-frequency figures of merit in RF circuits by measuring DC temperature with CMOS-compatible built-in sensors.
  • Keywords
    CMOS integrated circuits; built-in self test; temperature sensors; CMOS; DC temperature; noninvasive RF built-in testing; on-chip temperature sensors; Circuit testing; Coupling circuits; Detectors; Frequency measurement; Monitoring; Performance evaluation; Radio frequency; Temperature measurement; Temperature sensors; Transceivers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2009. ITC 2009. International
  • Conference_Location
    Austin, TX
  • Print_ISBN
    978-1-4244-4868-5
  • Electronic_ISBN
    978-1-4244-4867-8
  • Type

    conf

  • DOI
    10.1109/TEST.2009.5355901
  • Filename
    5355901
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2708969