Title :
EDA for analog DFT? - designers must get on the bus
Author_Institution :
LogicVision (Canada), Inc., Ottawa, ON, Canada
Abstract :
Design for test (DFT) for analog functions lags far behind that for digital functions, and as a result there is virtually no automation (except BIST for SerDes, PLL, and DDR). Before such automation can be developed, we must first understand the reasons for this lag and address them, since without a widely used technique, EDA companies cannot develop truly useful DFT automation. Analog design has no general-purpose DFT technique comparable to digital´s scan-based design and testing. The closest possibility is the analog bus, but it is often inadequate. Let´s consider three important reasons for the lack of a general analog DFT technique.
Keywords :
design for testability; electronic design automation; DFT automation; EDA; analog DFT; analog bus; analog design; analog functions; design for test; electronic design automation; scan-based design; scan-based testing; Automatic testing; Circuit faults; Circuit simulation; Circuit testing; Design automation; Design for testability; Electronic design automation and methodology; Integrated circuit testing; Logic design; Logic testing;
Conference_Titel :
Test Conference, 2009. ITC 2009. International
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-4868-5
Electronic_ISBN :
978-1-4244-4867-8
DOI :
10.1109/TEST.2009.5355909