DocumentCode
2709128
Title
Predictive solutions for test - The next DFT paradigm?
Author
Allsup, Chris ; Kapur, Rohit
Author_Institution
Synopsys, Inc., Mountain View, CA, USA
fYear
2009
fDate
1-6 Nov. 2009
Firstpage
1
Lastpage
1
Abstract
The current approach to implementing DFT assumes the results will meet designers´ quality and cost goals without impacting design functionality or performance. Given the growing complexity of designs, this is not always the case. Instead, ¿predictive test solutions¿ may be needed to make DFT architectural tradeoffs and reliably predict test outcomes prior to implementation. Predictive solutions could help designers make highly informed decisions about test much earlier in the design cycle. The panel will discuss the feasibility of predictive solutions, what design and test tradeoffs they should consider, how accurate their predictions need to be, and whether companies are currently willing to pay for them.
Keywords
design for testability; DFT paradigm; design functionality; design performance; predictive test solutions; Automatic test pattern generation; Automatic testing; Cost function; Design for testability; Logic design; Logic testing; Performance analysis; Performance evaluation; Power system reliability; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2009. ITC 2009. International
Conference_Location
Austin, TX
Print_ISBN
978-1-4244-4868-5
Electronic_ISBN
978-1-4244-4867-8
Type
conf
DOI
10.1109/TEST.2009.5355911
Filename
5355911
Link To Document