• DocumentCode
    2709128
  • Title

    Predictive solutions for test - The next DFT paradigm?

  • Author

    Allsup, Chris ; Kapur, Rohit

  • Author_Institution
    Synopsys, Inc., Mountain View, CA, USA
  • fYear
    2009
  • fDate
    1-6 Nov. 2009
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    The current approach to implementing DFT assumes the results will meet designers´ quality and cost goals without impacting design functionality or performance. Given the growing complexity of designs, this is not always the case. Instead, ¿predictive test solutions¿ may be needed to make DFT architectural tradeoffs and reliably predict test outcomes prior to implementation. Predictive solutions could help designers make highly informed decisions about test much earlier in the design cycle. The panel will discuss the feasibility of predictive solutions, what design and test tradeoffs they should consider, how accurate their predictions need to be, and whether companies are currently willing to pay for them.
  • Keywords
    design for testability; DFT paradigm; design functionality; design performance; predictive test solutions; Automatic test pattern generation; Automatic testing; Cost function; Design for testability; Logic design; Logic testing; Performance analysis; Performance evaluation; Power system reliability; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2009. ITC 2009. International
  • Conference_Location
    Austin, TX
  • Print_ISBN
    978-1-4244-4868-5
  • Electronic_ISBN
    978-1-4244-4867-8
  • Type

    conf

  • DOI
    10.1109/TEST.2009.5355911
  • Filename
    5355911