• DocumentCode
    2709316
  • Title

    An effective image segmentation technique for the SEM image

  • Author

    Lee, Jang Hee ; Yoo, Suk In

  • Author_Institution
    Artificial Intell.&Comput. Vision Lab., Seoul Nat. Univ., Seoul
  • fYear
    2008
  • fDate
    21-24 April 2008
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    There have been lots of efforts to replace the human eye inspection of the SEM image by automatic inspection based on the reference comparison method. The two kinds of inspection methods exist: the direct comparison method and the indirect comparison method. The more widely used indirect comparison method requires segmentation step which is to split the original image into two regions, foreground region and background region. Especially the segmentation of SEM image is not easy due to high noise level, variation of the image offset, and the diversity of patterns. In previous work, the ridge detector had been used to overcome such characteristics of the SEM image. In this paper, we present an effective segmentation method developed on the watershed segmentation algorithm, global-local threshold method, Laplacian of Gaussian filter, and non-maximum suppression. Applied for segmentation of various SEM images, the presented method showed the accuracy of 94% for ID image type and 98% for 2D image type.
  • Keywords
    Gaussian processes; automatic optical inspection; filtering theory; image segmentation; scanning electron microscopes; semiconductor device manufacture; Gaussian filter; background region; foreground region; global-local threshold method; human eye inspection; indirect comparison method; non maximum suppression; reference comparison method; scanning electron microscope; semiconductor industry; watershed image segmentation algorithm; Artificial intelligence; Computer vision; Detectors; Humans; Image edge detection; Image segmentation; Inspection; Scanning electron microscopy; Semiconductor device noise; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Technology, 2008. ICIT 2008. IEEE International Conference on
  • Conference_Location
    Chengdu
  • Print_ISBN
    978-1-4244-1705-6
  • Electronic_ISBN
    978-1-4244-1706-3
  • Type

    conf

  • DOI
    10.1109/ICIT.2008.4608647
  • Filename
    4608647