DocumentCode :
2709324
Title :
Maximum Margin Clustering with Pairwise Constraints
Author :
Hu, Yang ; Wang, Jingdong ; Yu, Nenghai ; Hua, Xian-Sheng
Author_Institution :
MOE-Microsoft Key Lab. of MCC, Univ. of Sci. & Technol. of China, Hefei
fYear :
2008
fDate :
15-19 Dec. 2008
Firstpage :
253
Lastpage :
262
Abstract :
Maximum margin clustering (MMC), which extends the theory of support vector machine to unsupervised learning, has been attracting considerable attention recently. The existing approaches mainly focus on reducing the computational complexity of MMC. The accuracy of these methods, however, has not always been guaranteed. In this paper, we propose to incorporate additional side-information, which is in the form of pairwise constraints, into MMC to further improve its performance. A set of pairwise loss functions are introduced into the clustering objective function which effectively penalize the violation of the given constraints. We show that the resulting optimization problem can be easily solved via constrained concave-convex procedure (CCCP). Moreover, for constrained multi-class MMC, we present an efficient cutting-plane algorithm to solve the sub-problem in each iteration of CCCP. The experiments demonstrate that the pairwise constrained MMC algorithms considerably outperform the unconstrained MMC algorithms and two other clustering algorithms that exploit the same type of side-information.
Keywords :
computational complexity; optimisation; pattern clustering; support vector machines; unsupervised learning; clustering objective function; computational complexity; maximum margin clustering; optimisation; pairwise constraint; pairwise loss function; support vector machine; unsupervised learning; Asia; Clustering algorithms; Computational complexity; Constraint optimization; Constraint theory; Data mining; Iterative methods; Optimization methods; Support vector machines; Unsupervised learning;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Data Mining, 2008. ICDM '08. Eighth IEEE International Conference on
Conference_Location :
Pisa
ISSN :
1550-4786
Print_ISBN :
978-0-7695-3502-9
Type :
conf
DOI :
10.1109/ICDM.2008.65
Filename :
4781120
Link To Document :
بازگشت