• DocumentCode
    2709667
  • Title

    Metallic and Superconducting Rectangular Cavity Resonators in TLM

  • Author

    Fichtner, Nikolaus ; Russer, Peter

  • Author_Institution
    Inst. for High-Frequency Eng., Technische Univ. Munchen, Miinchen
  • fYear
    2006
  • fDate
    11-16 June 2006
  • Firstpage
    292
  • Lastpage
    295
  • Abstract
    Power loss modeling of electromagnetic (EM) structures under consideration of the frequency dependent surface impedance of metallic normal conductors and superconductors is performed using time domain transmission line matrix method (TLM). The surface boundaries of the low loss conductors, characterized by the reflection coefficient, are modeled by digital filters. The method describes a hybrid approach to include the boundary conditions of conductors in frequency domain in a time domain full wave analysis. The validation of the used technique is done with rectangular cavity resonators. The calculation of the quality factors is performed with a Prony series expansion of the TLM time signal and extraction of the resonance frequencies and the Q factors. Finally the high accuracy of the hybrid method and the Prony expansion is demonstrated
  • Keywords
    Q-factor; digital filters; superconducting cavity resonators; time-domain analysis; transmission line matrix methods; Prony series expansion; digital filters; electromagnetic structures; metallic normal conductors; metallic rectangular cavity resonators; metallic superconductors; power loss modeling; quality factor; superconducting rectangular cavity resonators; surface impedance; time domain full wave analysis; transmission line matrix method; Cavity resonators; Conductors; Electromagnetic modeling; Frequency dependence; Magnetic losses; Propagation losses; Q factor; Superconducting transmission lines; Superconductivity; Surface impedance; Prony-method; Transmission line matrix method (TLM); digital filters; high quality cavity resonators; surface impedance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2006. IEEE MTT-S International
  • Conference_Location
    San Francisco, CA
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-9541-7
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2006.249491
  • Filename
    4014884