DocumentCode :
2709667
Title :
Metallic and Superconducting Rectangular Cavity Resonators in TLM
Author :
Fichtner, Nikolaus ; Russer, Peter
Author_Institution :
Inst. for High-Frequency Eng., Technische Univ. Munchen, Miinchen
fYear :
2006
fDate :
11-16 June 2006
Firstpage :
292
Lastpage :
295
Abstract :
Power loss modeling of electromagnetic (EM) structures under consideration of the frequency dependent surface impedance of metallic normal conductors and superconductors is performed using time domain transmission line matrix method (TLM). The surface boundaries of the low loss conductors, characterized by the reflection coefficient, are modeled by digital filters. The method describes a hybrid approach to include the boundary conditions of conductors in frequency domain in a time domain full wave analysis. The validation of the used technique is done with rectangular cavity resonators. The calculation of the quality factors is performed with a Prony series expansion of the TLM time signal and extraction of the resonance frequencies and the Q factors. Finally the high accuracy of the hybrid method and the Prony expansion is demonstrated
Keywords :
Q-factor; digital filters; superconducting cavity resonators; time-domain analysis; transmission line matrix methods; Prony series expansion; digital filters; electromagnetic structures; metallic normal conductors; metallic rectangular cavity resonators; metallic superconductors; power loss modeling; quality factor; superconducting rectangular cavity resonators; surface impedance; time domain full wave analysis; transmission line matrix method; Cavity resonators; Conductors; Electromagnetic modeling; Frequency dependence; Magnetic losses; Propagation losses; Q factor; Superconducting transmission lines; Superconductivity; Surface impedance; Prony-method; Transmission line matrix method (TLM); digital filters; high quality cavity resonators; surface impedance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 2006. IEEE MTT-S International
Conference_Location :
San Francisco, CA
ISSN :
0149-645X
Print_ISBN :
0-7803-9541-7
Electronic_ISBN :
0149-645X
Type :
conf
DOI :
10.1109/MWSYM.2006.249491
Filename :
4014884
Link To Document :
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