Title :
Enhancing the Rapid Object Process for Embedded System (ROPES) Metamodel to Support Pattern Oriented Development
Author :
Isa, Mohd Adham ; Jawawi, Dayang Norhayati Abang
Author_Institution :
Dept. of Software Eng., Univ. Technol. Malaysia, Skudai, Malaysia
Abstract :
The complexity of Embedded Real Time (ERT) software development represents a challenging of analyzing, designing and building ERT software. From this standpoint, the complexity of ERT software development means a challenging to adopt all ERT software requirements such as timing and resource constraints into its software life cycle. Against these claims, a wide range of software development methodologies has been devised such as patterns. Patterns codify an effective solution for recurring problems, which allows software engineers to reuse. By applying patterns into ERT software development, the complexity of ERT software development may be decreased and at the same time promote a high degree of reuse through software patterns. This paper presents the integrated Rapid Object Process for Embedded System (ROPES) and Pattern-oriented Analysis and Design (POAD) methodology to show a promising way to build ERT software with software patterns reuse. To make the integrated methodology more compelling and confirm the rules of patterns oriented modeling, the integrated ROPES and POAD metamodel has been developed The aim of the integrated metamodel is to conform to the correctness of the integrated methodology modeling rules together with patterns. To prove the correctness of the integrated metamodel, the mapping process between the MetaObject Facility (MOF) and proposed metamodel by using graph theory has been conducted.
Keywords :
embedded systems; formal specification; formal verification; metacomputing; software prototyping; software reusability; ERT software; embedded real time system; graph theory; integrated metamodel; metaobject facility; pattern-oriented analysis; patterns oriented modeling; rapid object process; software development; software life cycle; software patterns reuse; Embedded computing; Embedded software; Embedded system; Hardware; Modeling; Pattern analysis; Programming; Real time systems; Software reusability; System testing; Embedded Real-Time System; Metamodel; Software Pattern;
Conference_Titel :
Computer Research and Development, 2010 Second International Conference on
Conference_Location :
Kuala Lumpur
Print_ISBN :
978-0-7695-4043-6
DOI :
10.1109/ICCRD.2010.49