• DocumentCode
    2710156
  • Title

    Enhancing the Rapid Object Process for Embedded System (ROPES) Metamodel to Support Pattern Oriented Development

  • Author

    Isa, Mohd Adham ; Jawawi, Dayang Norhayati Abang

  • Author_Institution
    Dept. of Software Eng., Univ. Technol. Malaysia, Skudai, Malaysia
  • fYear
    2010
  • fDate
    7-10 May 2010
  • Firstpage
    255
  • Lastpage
    259
  • Abstract
    The complexity of Embedded Real Time (ERT) software development represents a challenging of analyzing, designing and building ERT software. From this standpoint, the complexity of ERT software development means a challenging to adopt all ERT software requirements such as timing and resource constraints into its software life cycle. Against these claims, a wide range of software development methodologies has been devised such as patterns. Patterns codify an effective solution for recurring problems, which allows software engineers to reuse. By applying patterns into ERT software development, the complexity of ERT software development may be decreased and at the same time promote a high degree of reuse through software patterns. This paper presents the integrated Rapid Object Process for Embedded System (ROPES) and Pattern-oriented Analysis and Design (POAD) methodology to show a promising way to build ERT software with software patterns reuse. To make the integrated methodology more compelling and confirm the rules of patterns oriented modeling, the integrated ROPES and POAD metamodel has been developed The aim of the integrated metamodel is to conform to the correctness of the integrated methodology modeling rules together with patterns. To prove the correctness of the integrated metamodel, the mapping process between the MetaObject Facility (MOF) and proposed metamodel by using graph theory has been conducted.
  • Keywords
    embedded systems; formal specification; formal verification; metacomputing; software prototyping; software reusability; ERT software; embedded real time system; graph theory; integrated metamodel; metaobject facility; pattern-oriented analysis; patterns oriented modeling; rapid object process; software development; software life cycle; software patterns reuse; Embedded computing; Embedded software; Embedded system; Hardware; Modeling; Pattern analysis; Programming; Real time systems; Software reusability; System testing; Embedded Real-Time System; Metamodel; Software Pattern;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Research and Development, 2010 Second International Conference on
  • Conference_Location
    Kuala Lumpur
  • Print_ISBN
    978-0-7695-4043-6
  • Type

    conf

  • DOI
    10.1109/ICCRD.2010.49
  • Filename
    5489528